Device and method for sensing programming status of non-volatile memory elements
US7426142B1 · kind B1 · utility
9Cited by
27References
20Claims
0Family size
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Key dates
| Filing date | May 1, 2006 |
| Grant date | Sep 16, 2008 |
| Priority date | — |
| Expiry date | Aug 27, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/5006
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A test circuit can test a status of a group of non-volatile elements. A current flowing to the group of non-volatile elements can be compared against a reference value. If the current is determined to be outside of a predetermined range, the non-volatile elements can be determined to be programmed. In particular embodiments, non-volatile elements can be sections of differential one-time programmable anti-fuse latch memory elements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.