Patent · US Active

High sensitivity slitless ion source mass spectrometer for trace gas leak detection

US7427751B2 · kind B2 · utility

2Cited by

20References

16Claims

0Family size

Assignee

Varian, Inc. · US

Inventors

J. Daniel Geist · Boxborough, US
Jeffrey Diep · Quincy, US
Peter Williams · San Carlos, US
Charles Perkins · Boston, US

Key dates

Filing date	Feb 15, 2006
Grant date	Sep 23, 2008
Priority date	—
Expiry date	Nov 27, 2026

Classification

Technology area (CPC H)Electricity
CPC primaryH01J49/147
WIPO fieldElectrical machinery, apparatus, energy
WIPO sectorElectrical engineering

Abstract

A mass spectrometer includes a main magnet having spaced-apart polepieces which define a gap, the main magnet producing a magnetic field in the gap, an ion source to generate ions and to accelerate the ions into the magnetic field in the gap, the ion source located outside the gap, and an ion detector to detect a selected species of the ions generated by the ion source and deflected by the magnetic field. The ion detector is located in the gap at a natural focus point of the selected species of ions. The mass spectrometer may be used in a trace gas leak detector.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.