Method and apparatus for scanning optical delay line
US7428086B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 4, 2006 |
| Grant date | Sep 23, 2008 |
| Priority date | — |
| Expiry date | Aug 4, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B26/0816
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A scanning optical delay line includes an optical path element that rotates about its central axis, such that a face is intermittently incident a beam of light to be optically delayed. When the beam is not incident the face, it is reflected onto a reinsertion line which provides a second opportunity for the beam to intersect the optical path element. The optical path element may include one or more parallelogram prisms, or parallel reflective surfaces to provide a substantially linear optical path length variation during the scan, which is produced by the rotation of the optical path element. A highly linear part of the rotation can be maximally used providing a high duty cycle, high linearity scanning optical delay line that permits high quality, high data rate applications.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.