Method and system for CT imaging using multi-spot emission sources

US7428292B2 · kind B2 · utility

Assignee

• General Electric Company · US

Inventors

• Bruno Kristiaan Bernard De Man · Clifton Park, US
• Colin Richard Wilson · Niskayuna, US
• Bernhard Erich Hermann Claus · Niskayuna, US
• Maria Iatrou · Hoboken, US
• James W. LeBlanc · Niskayuna, US
• Dirk Wim Jos Beque · Munich, DE
• Samit Kumar Basu · Niskayuna, US
• Mark Ernest Vermilyea · Niskayuna, US
• Zhye Yin · Schenectady, US

Key dates

• Filing date: Nov 24, 2006
• Grant date: Sep 23, 2008
• Expiry date: Nov 24, 2026

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N2223/612
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A CT imaging system includes a rotatable gantry having an opening to receive an object to be scanned. A plurality of x-ray emission sources are attached to the rotatable gantry, each x-ray emission source configured to emit x-rays in a conebeam toward the object. The CT imaging system also includes a plurality of x-ray detector arrays attached to the gantry and positioned to receive x-rays passing through the object. At least one x-ray detector array of the plurality of x-ray detector arrays is configured to receive x-rays from more than one x-ray emission source.