XRF analyzer
US7430274B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 27, 2007 |
| Grant date | Sep 30, 2008 |
| Priority date | — |
| Expiry date | Feb 27, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/076
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An XRF system, preferably handheld, includes an X-ray source for directing X-rays to a sample, a detector responsive to X-rays emitted by the sample, and a filter assembly with multiple filter materials located between the X-ray source and the detector. An analyzer is responsive to detector and is configured to analyze the intensities of X-rays irradiated by the sample at one power setting and to choose a filter material which suppresses certain intensities with respect to other intensities. A device, controlled by the analyzer, automatically moves the filter assembly to the chosen filter material and then the analyzer increases the power setting to analyze certain non-suppressed intensities.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.