Patent · US Expired

Statistical model for global localization

US7430497B2 · kind B2 · utility

17Cited by
57References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 31, 2002
Grant dateSep 30, 2008
Priority date
Expiry dateJul 19, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06V30/1423
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A system and process for determining the location of a captured image from a larger image is described. Using a list of determined locations, the system is able to determine the best or most likely path of a pen tip.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.