Patent · US Expired

Apparatus and method for providing spatially-selective on-line mass or volume measurements of manufactured articles

US7432453B2 · kind B2 · utility

3Cited by
16References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 22, 2004
Grant dateOct 7, 2008
Priority date
Expiry dateJun 7, 2025

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S177/06
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

This invention relates to a method and apparatus for mass and/or volume measurements of manufactured articles. More particularly, this invention relates to a method and apparatus for mass and/or volume measurements that can be performed on-line in a part manufacturing process. On-line measurement of the mass or volume of material contained in a specific region of interest of the manufactured items is performed 100% on-line. Real-time process control information is based on real-time measurement of the mass or volume of material contained in a specific region of interest of a manufactured item. Automated quality control inspection for manufactured articles is based on real-time measurement of the mass or volume of material contained in a specific region of interest of manufactured items. A manufacturing closed-loop process is directly corrected to keep it within control limits based on real-time measurement of the mass or volume of material contained in a specific region of interest of manufactured items soon after these items are manufactured.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.