Range mapping using speckle decorrelation
US7433024B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 27, 2007 |
| Grant date | Oct 7, 2008 |
| Priority date | — |
| Expiry date | May 18, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T7/74
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for mapping includes projecting a primary speckle pattern from an illumination assembly into a target region. A plurality of reference images of the primary speckle pattern are captured at different, respective distances from the illumination assembly in the target region. A test image of the primary speckle pattern that is projected onto a surface of an object in the target region is captured and compared to the reference images so as to identify a reference image in which the primary speckle pattern most closely matches the primary speckle pattern in the test image. The location of the object is estimated based on a distance of the identified reference image from the illumination assembly.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.