Apparatus and method for detecting lens thickness
US7433027B2 · kind B2 · utility
4Cited by
36References
28Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 16, 2005 |
| Grant date | Oct 7, 2008 |
| Priority date | — |
| Expiry date | Jul 21, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M11/0214
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to a non-contact/non-destructive method and apparatus for measuring the thickness of an ophthalmic lens. The present invention also provides a method for inspecting or measuring the base curve of a lens.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.