Device for the examination of optical properties of surfaces

US7433055B2 · kind B2 · utility

Assignee

• BYK-Gardner GmbH · DE

Inventors

• Peter Schwarz · Speyer, DE
• Uwe Sperling · Geretsried, DE

Key dates

• Filing date: Jul 6, 2005
• Grant date: Oct 7, 2008
• Expiry date: Jun 4, 2026

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N2021/8835
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A device for examining the optical properties of surfaces includes at least one first radiation device which emits radiation to a surface to be examined at a first predetermined spatial angle; at least one first detector device for capturing the radiation emitted to and reflected back from the surface, wherein the first detector device, allowing a local resolution of detected radiation, is positioned at least at a second predetermined spatial angle relative to the surface; and at least one further radiation device or second detector device emitting radiation to the surface to be examined at a third predetermined spatial angle or detecting radiation emitted to and reflected back from the surface.