Method for verifying scan precision of a laser measurement machine
US7433797B2 · kind B2 · utility
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2References
4Claims
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Key dates
| Filing date | Mar 16, 2006 |
| Grant date | Oct 7, 2008 |
| Priority date | — |
| Expiry date | Apr 19, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B21/042
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for verifying scan precision of a laser measurement machine includes the steps of: preparing a standardized 3D profile model; determining an ideal curved surface as a conventional true value of the standardized 3D profile model; scanning the standardized 3D profile model by the laser measurement machine and obtaining point cloud data; calculating a bias between each point in the point cloud and the ideal curved surface; evaluating the veracity of the laser measurement machine by using the largest bias; and evaluating the receptiveness of the laser measurement machine.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.