Patent · US Active

Epitaxial growth method

US7435666B2 · kind B2 · utility

9Cited by
5References
16Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJan 18, 2006
Grant dateOct 14, 2008
Priority date
Expiry dateNov 10, 2026

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/0262
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Provided is an epitaxial growth method for forming a high-quality crystalline growth semiconductor wafer. The method includes forming a buffer layer on a single crystalline wafer using a single crystalline material; forming a mask layer on the buffer layer; forming a plurality of holes in the mask layer using a laser to expose portions of the buffer layer; forming wells having a predetermined depth in the exposed portions of the buffer layer by injecting an etchant into the holes; removing the mask layer and annealing the buffer layer to form a porous buffer layer having cavities obtained by the wells; and forming a crystalline material layer on the porous buffer layer using an epitaxial growth process.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.