Methods for measuring optical characteristics by differential diffractive scanning
US7435941B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 12, 2004 |
| Grant date | Oct 14, 2008 |
| Priority date | — |
| Expiry date | Oct 23, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B2007/13727
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and systems for measuring and/or inspecting a characteristic of an optical article are provided. In one example, a method includes illuminating an optical article with a focused beam of light, detecting the light with a sensor after interacting with the optical article, determining a deflection angle of the beam of light, and determining a characteristic of the optical article based on the deflection angle. In one example, a system includes a light source, an optical element, and a sensor. The optical element focuses light from the light source to a reference location, the sensor detects the light from the reference location and generates signals associated with the intensity and position of the light received. A processor may receive the signals from the sensor and thereby determine a deflection angle of the light from the probe path.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.