Scanning probe microscope control system
US7435955B2 · kind B2 · utility
2Cited by
18References
20Claims
0Family size
Inventor
Key dates
| Filing date | Jul 29, 2005 |
| Grant date | Oct 14, 2008 |
| Priority date | — |
| Expiry date | Jan 16, 2026 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S977/85
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for controlling the operation of a scanning probe microscope that greatly simplifies the microscope's operation is disclosed. The software design incorporates several advanced features such as a sample designator file, video tutorials, automation algorithms, and the ability to remotely load sample designator files and video tutorials.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.