Probe skates for electrical testing of convex pad topologies
US7436192B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jan 31, 2007 |
| Grant date | Oct 14, 2008 |
| Priority date | — |
| Expiry date | Mar 27, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06733
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe for engaging a conductive pad is provided. The probe includes a probe contact end for receiving a test current, a probe retention portion below the contact end, a block for holding the probe retention portion, a probe arm below the retention portion, a probe contact tip below the arm, and a generally planar self-cleaning skate disposed perpendicular below the contact tip. The self-cleaning skate has a square front, a round back and a flat middle section. The conductive pad is of generally convex shape having a granular non-conductive surface of debris and moves to engage the skate, whereby an overdrive motion is applied to the pad causing the skate to move across and scrub non-conductive debris from the pad displacing the debris along the skate and around the skate round back end to a position on the skate that is away from the pad.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.