Virtual test head for IC
US7436197B1 · kind B1 · utility
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8References
5Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Sep 23, 2004 |
| Grant date | Oct 14, 2008 |
| Priority date | — |
| Expiry date | Mar 11, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31907
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In a test system for a semiconductor device, the device under test (DUT) is remotely located relative to the tester that generates the test vector signals. The tester and remotely located DUT are connected by a serial connection and each includes a serializer-deserializer for converting outgoing data to serial form and deserializing incoming data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.