System and method for testing a device
US7437262B2 · kind B2 · utility
14Cited by
4References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 18, 2003 |
| Grant date | Oct 14, 2008 |
| Priority date | — |
| Expiry date | Oct 19, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/273
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system for testing a device includes a processor that operates to execute instructions, where the instructions are used to test a device. The processor also operates to generate test signals associated with the test instructions. An interface apparatus is coupled to the processor and operates to communicate the test signals to the device. The interface apparatus includes connectors, where each connector operates to communicate at least one of the test signals.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.