Method and system for optimizing reliability and performance of programming data in non-volatile memory devices
US7437498B2 · kind B2 · utility
87Cited by
5References
8Claims
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Key dates
| Filing date | Jul 26, 2004 |
| Grant date | Oct 14, 2008 |
| Priority date | — |
| Expiry date | Jun 4, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C11/5621
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods of managing memory devices, and devices so managed. A value of a parameter, that is used to program one or more memory cells, is adapted to a monitored condition of the cell(s). Either the number of bits per cell is held fixed or the monitored condition is an intrinsic condition of the cell(s). The initial value of the parameter is optimized for those specific cells, relative to a pre-selected criterion, by programming the cell(s) in accordance with candidate values of the parameter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.