Automatic self-testing of an internal device in a closed system
US7437644B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 29, 2004 |
| Grant date | Oct 14, 2008 |
| Priority date | — |
| Expiry date | Dec 9, 2026 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61N1/37241
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A closed system such as a TET system in which self-testing of all components of the implantable medical device whose malfunction could negatively impact on the proper operation of the closed system is automatically and periodically performed without triggering from an external device. In addition, a closed system including automatic, periodic self-testing of the implantable medical device in which, whenever practical, testing of the components is synchronized with telemetric communication of the external device whereby an external RF field generated by the external device is used to supply necessary power to perform self-testing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.