Patent · US Expired

Method and system for s-parameter generation

US7437693B1 · kind B1 · utility

4Cited by
6References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 31, 2005
Grant dateOct 14, 2008
Priority date
Expiry dateApr 30, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F2119/06
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Disclosed are methods and systems for generating S-parameters. In some embodiments, the methods and systems comprise creating (e.g., extracting, calculating, generating), in part or whole into the development environment, S-parameters of the given netlist, which may be represented in part or whole by S-parameters. This is useful in data abstraction, topology complexity reduction, or data hiding. Some embodiments provide convenient and automated approaches for what is normally a complicated and laborious process. Some embodiments provide the ability to generate S-parameters for the specified part or whole topology netlist. Ports can be specified at any node in the topology. Non-linear devices, e.g., IBIS buffers, diodes, non-linear terminations, can be automatically excluded from generated S-parameter model. Additionally, adding the device package models is an available option. Once generated, S-parameter models can be automatically replaced by the original part or whole topology with a Black Box and the original connections are maintained.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.