Identifying optical fiber segments and determining characteristics of an optical device under test based on fiber segment scatter pattern data
US7440087B2 · kind B2 · utility
95Cited by
6References
20Claims
0Family size
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Key dates
| Filing date | Feb 23, 2005 |
| Grant date | Oct 21, 2008 |
| Priority date | — |
| Expiry date | Dec 27, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M11/3172
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Complex data is obtained from OFDR backscatter measurements for an optical device under test (DUT). That complex scatter pattern data may be used along with a previously-determined fiber segment pattern to identify the fiber segment within the DUT, even when the DUT is an optical network DUT that includes multiple fibers coupled to perform one or more functions. In other non-limiting example applications, the OFDR scatter pattern data can be used to identify where in the DUT a loss occurred and where in the DUT a temperature change occurred.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.