Patent · US Expired

SOA-MZI device fault isolation

US7440179B2 · kind B2 · utility

1Cited by
8References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 28, 2003
Grant dateOct 21, 2008
Priority date
Expiry dateOct 8, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01S5/5045
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

The method of isolating faults internal to, for example, from tonic integrated circuits by diverting a portion of certain input and output signals to integrated photo detectors. By analyzing the admitted optical signal in each of plural photo detectors, falls within the circuit can be isolated.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.