Method for scattered radiation correction of a CT system

US7440536B2 · kind B2 · utility

Assignee

• Siemens Aktiengesellschaft · DE

Inventors

• Herbert Bruder · Hemhofen, DE
• Martin Petersilka · Wiesendorf, DE
• Rainer Raupach · Heroldsbach, DE
• Karl Stierstorfer · Erlangen, DE

Key dates

• Filing date: Oct 6, 2006
• Grant date: Oct 21, 2008
• Expiry date: Nov 25, 2026

Classification

• Technology area (CPC A): Human Necessities
• CPC primary: A61B6/583
• WIPO field: Medical technology
• WIPO sector: Instruments

Abstract

A method for scattered radiation correction of a CT system, including at least two focus/detector systems operated angularly offset from one another, is disclosed. In the method, at at least one phantom, similar to the examined object at least in a subregion, for at least one of the focus/detector systems, the scattered radiation intensity occurring is determined in the detector of a focus/detector system during the operation of the at least one focus of at least one other focus/detector system. Further, the spatial distribution thereof is stored for a number of angles of rotation of the focus/detector systems. During scanning of the object, the scattered radiation intensities, determined with the aid of a similar phantom that originate from the at least one other focus/detector system, are subtracted from the measured intensities of the first focus/detector system while taking account of the spatial orientation of the focus/detector systems and the beam respectively considered. Finally, absorption values are calculated with the aid of the intensity values thus corrected, and CT pictures or CT volume data are thereby reconstructed.