Method and measuring arrangement for nondestructive analysis of an examination object by means of x-radiation

US7440542B2 · kind B2 · utility

Assignee

• Siemens Aktiengesellschaft · DE

Inventors

• Joachim Baumann · Dortmund, DE
• Martin Engelhardt · Munich, DE
• Jörg Freudenberger · Eckental, DE
• Eckhard Hempel · Bad Mergentheim, DE
• Martin Hoheisel · Erlangen, DE
• Thomas Mertelmeier · Erlangen, DE
• Stefan Popescu · Erlangen, DE
• Manfred Schuster · Schrick, AT

Key dates

• Filing date: Jan 31, 2007
• Grant date: Oct 21, 2008
• Expiry date: Jan 31, 2027

Classification

• Technology area (CPC G): Physics
• CPC primary: G21K2207/005
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method and a measuring arrangement are disclosed for nondestructive analysis of an examination object. In at least one embodiment of the method, x-radiation having a specific energy spectrum is generated by an x-ray source, with the aid of at least one x-ray/optical grating in the beam path of the x-radiation there is generated a standing wave field of this x-radiation that is positioned at least partially in the examination object, and the radiation excited by the x-ray standing wave field in the examination object is measured as a function of at least one relative position between the examination object and the x-ray standing wave field. Further, a material distribution in the examination object is inferred from the measurement result of the radiation excited by the x-ray standing wave field.