Combining multiple independent sources of information for classification of devices under test
US7440862B2 · kind B2 · utility
0Cited by
9References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 10, 2004 |
| Grant date | Oct 21, 2008 |
| Priority date | — |
| Expiry date | May 10, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31835
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Embodiments of the present invention use the results of a plurality of defect detecting tests and adjust the result of each test in a manner that reflects the accuracy of the test that produced it. A manufactured unit can then be evaluated using a mathematical combination of the adjusted results.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.