Test mode and test method for a temperature tamper detection circuit
US7443176B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 23, 2006 |
| Grant date | Oct 28, 2008 |
| Priority date | — |
| Expiry date | Oct 22, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K15/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An integrated circuit temperature sensor includes a sensor to determine whether the integrated circuit is currently exposed to a relatively low or high temperature. A measured voltage across the base-emitter of a bipolar transistor is selected if the sensor indicates exposure to the relatively low temperature or, a measured delta voltage across the base-emitter of the bipolar transistor is selected if the sensor indicates exposure to the relatively high temperature. The voltage across the base-emitter is compared against a first reference for determining exposure to a too cold condition or the selected measured delta voltage across the base-emitter is compared against a second reference for determining exposure to a too hot condition. In a test mode, the measured delta voltage across the base-emitter and/or the measured voltage across the base-emitter are scaled.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.