Tunable laser for dynamic measurement
US7443510B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 21, 2005 |
| Grant date | Oct 28, 2008 |
| Priority date | — |
| Expiry date | Mar 23, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B2290/25
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for monitoring changes in a gap which corresponds to changes in a particular environmental parameter using a tunable laser and interferometer at high frequency is disclosed. The laser light provided to the interferometer is swept through a small range of wavelengths. Light modulated by the interferometer is detected and a non-sinusoidal light intensity output curve is created, a reference point on the curve identified and subsequent sweep of the laser performed. The difference in time, wavelength, or frequency at the occurrence of the reference point between the two sweeps allows for measuring the relative changes in the gap and, as a result, the change in the environmental parameter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.