System and method for laser temperature compensation
US7443894B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 20, 2007 |
| Grant date | Oct 28, 2008 |
| Priority date | — |
| Expiry date | Apr 27, 2027 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01S5/06808
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A method for compensating for changes in output power or wavelength of an optical source with temperature. Many optical sources have power and/or wavelength variations with temperature which can be compensated by open- or closed-loop methods if a method of accurately measuring the optical source temperature is available. The voltage across a semiconductor junction varies with temperature. Measuring the optical source power or wavelength variation with temperature and tracking the voltage across the semiconductor junction provides a means for compensating an instrument for temperature induced optical output power or wavelength variations. An important field of application is optical density or turbidity measurements in cellular media.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.