Exempt source for an x-ray fluorescence device
US7443951B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 1, 2005 |
| Grant date | Oct 28, 2008 |
| Priority date | — |
| Expiry date | Apr 1, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/076
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An x-ray fluorescence (XRF) device and a method for using the same to analyze a sample are described. The EMRXG source of the XRF device has a configuration that allows a greater amount of EMRXG to impinge on the sample being analyzed. The x-ray detector of the XRF device has a configuration that allows a greater amount of x-rays emitted by the sample to impinge on the detector. With such a configuration, the size and cost of the x-ray fluorescence device decreases. As well, fewer EMRXG are needed from the EMRXG source because of the greater efficiency and an exempt EMRXG source that is exempt from radioactivity licensing requirements can be used.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.