Patent · US Active

Laser fresnel distance measuring system and method

US7446860B1 · kind B1 · utility

0Cited by
2References
29Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 18, 2006
Grant dateNov 4, 2008
Priority date
Expiry dateOct 19, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01S17/02
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and system for determining range to a target are provided. A beam of electromagnetic energy is transmitted through an aperture in an opaque screen such that a portion of the beam passes through the aperture to generate a region of diffraction that varies as a function of distance from the aperture. An imaging system is focused on a target plane in the region of diffraction with the generated image being compared to known diffraction patterns. Each known diffraction pattern has a unique value associated therewith that is indicative of a distance from the aperture. A match between the generated image and at least one of the known diffraction patterns is indicative of a distance between the aperture and target plane.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.