Patent · US Active

Method for verification of particles having a sensor area and sensor arrangement for carrying out this method

US7446870B2 · kind B2 · utility

1Cited by

4References

17Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventors

Frank Arndt · Berlin, DE
Jan Grahmann · Berlin, DE
Jens-Christian Holst · Berlin, DE
Jens Dahl Jensen · Berlin, DE
Ursus Krüger · Berlin, DE
Hendrik Ronsch · Berlin, DE
Arno Steckenborn · Berlin, DE

Key dates

Filing date	Sep 27, 2006
Grant date	Nov 4, 2008
Priority date	—
Expiry date	Nov 2, 2026

Classification

Technology area (CPC G)Physics
CPC primaryG01N2291/0423
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The invention relates to a method for verification of particles, in particular of nanoparticles (16), in which a sensor area (15) is made available for this purpose, on which the particles can accumulate. The invention also relates to a sensor arrangement having a sensor area (15) which is suitable for carrying out the method mentioned. The invention provides for a plurality of sensor areas (15) to be arranged, on which particles which each have different characteristics can accumulate. For example, this makes it possible to classify nanoparticles (16) of different size, thus advantageously allowing a statement to be made on the size distribution of the nanoparticles (16) in a nanopowder.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.