Patent · US Expired

Inversion of scan clock for scan cells

US7447961B2 · kind B2 · utility

19Cited by
17References
30Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJul 29, 2004
Grant dateNov 4, 2008
Priority date
Expiry dateJun 2, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/318594
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

In one embodiment, an apparatus comprises a scan circuit including at least a first and a second clock domain and a scan chain having a first plurality of scan cells positioned in the first clock domain and a second plurality of scan cells positioned in the second clock domain. A scan clock source, coupled to the scan chain, generates a first scan clock signal to the first plurality of scan cells and a second scan clock signal to the second plurality of scan cells. The first and the second clock signals have an inverted relationship.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.