Inspection system and associated method
US7448271B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 17, 2005 |
| Grant date | Nov 11, 2008 |
| Priority date | — |
| Expiry date | Jan 23, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/2694
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method for inspecting a structure are provided. The system includes at least one non-destructive inspection (“NDI”) sensor capable of acquiring data indicative of at least a portion of the structure, and at least one positional sensor for acquiring positional data of the NDI sensor. The system also includes a mechanism operable to trigger the NDI sensor and/or the positional sensor to acquire data such that data indicative of the structure and the positional data are acquired at approximately the same time. The system further includes a movable arm carrying the sensors and movably attached to a base. The system includes a data acquisition system capable of communicating with the sensors such that the data acquisition system generates information indicative of at least a portion of the structure based on the data acquired by the sensors.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.