Patent · US Expired

Apparatus and method for analyzing samples in a dual ion trap mass spectrometer

US7449686B2 · kind B2 · utility

19Cited by
45References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 7, 2005
Grant dateNov 11, 2008
Priority date
Expiry dateJun 7, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J49/004
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

The present invention is an improved apparatus and method for mass spectrometry using a dual ion trapping system. In a preferred embodiment of the present invention, three “linear” multipoles are combined to create a dual linear ion trap system for trapping, analyzing, fragmenting and transmitting parent and fragment ions to a mass analyzer—preferably a TOF mass analyzer. The dual ion trap according to the present invention includes two linear ion traps, one positioned before an analytic quadrupole and one after the analytic multipole. Both linear ion traps are multipoles composed of any desired number of rods—i.e. the traps are quadrupoles, pentapoles, hexapoles, octapoles, etc. Such arrangement enables one to maintain a high “duty cycle” while avoiding “memory effects” and also reduces the power consumed in operating the analyzing quadrupole.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.