Deconvolving far-field images using scanned probe data
US7449688B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 2, 2005 |
| Grant date | Nov 11, 2008 |
| Priority date | — |
| Expiry date | Jan 31, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/002
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A method for deconvolving far-field optical images beyond the diffraction limit includes the use of near-field optical and other scanned probe imaging data to provide powerful and new constraints for the deconvolution of far-field data sets. Near-field data, such as that which can be obtained from atomic force microscopy on a region of the far-field data set in an integrated and inter-digitate way, is used to produce resolutions beyond the diffraction limit of the lens that is being used. In the case of non-linear optical imaging or other microscopies, resolutions beyond that which is achievable with these microscopies can be obtained.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.