Non-invasive electric-filed-detection device and method
US7450237B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Aug 18, 2004 |
| Grant date | Nov 11, 2008 |
| Priority date | — |
| Expiry date | Jan 26, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R29/0885
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to a device which is used for the non-invasive detection of an electric potential or field, of the spatial and/or the temporal derivatives thereof, in a medium with a linear or quadratic electrooptical effect. The inventive device comprises: an optical source which is used to illuminate at least one zone of the medium that is to be probed with a light beam, the path of which defines an optical axis; and means for mapping the phase shift of the beam in the zone to be probed. Measuring means which are used to map the light beam phase shift comprise a confocal microscope in which the zone to be probed is placed in order to form an image of a plane of said zone.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.