Method and arrangement for determining an object contour
US7450762B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jul 21, 2004 |
| Grant date | Nov 11, 2008 |
| Priority date | — |
| Expiry date | Nov 12, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30024
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method is disclosed for determining a sought object contour in a digital microscope image, which includes a plurality of image elements and reproduces a biological material. The method includes assigning edge values to at least a first subset of the image elements in the image; assigning values of a first gradient vector component whose values each includes a first linear combination of edge values of some surrounding image elements to at least a second subset of the image elements in the image; assigning values of a second gradient vector component whose values each include a second linear combination of edge values of some surrounding image elements to at least a third subset of the image elements in the image; and calculating an estimate of the sought object contour based upon values of the first and second gradient vector components.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.