Method and apparatus for product defect classification

US7451009B2 · kind B2 · utility

Assignee

• General Instrument Corporation · US

Inventors

• David Grubb · Doylestown, US
• Tom Doblmaier · Washington, US
• Glen P. Goffin · Dublin, US
• Evan A. Groat · Lansdale, US
• Steven M. Mensoff · Blue Bell, US
• Dan Quigley · Woodinville, US

Key dates

• Filing date: Dec 22, 2005
• Grant date: Nov 11, 2008
• Expiry date: Aug 28, 2026

Classification

• Technology area (CPC G): Physics
• CPC primary: G06Q10/00
• WIPO field: IT methods for management
• WIPO sector: Electrical engineering

Abstract

Method and apparatus for processing defect data indicative of defects in a product is described. In one example, each of the defects is assigned one of a plurality of severity levels and one of a plurality of impact levels. The defects are classified into categories based on combinations of severity level and impact level. A graphic representative of a topographical relation among numbers of defects in the categories is generated. The graphic is displayed on a graphical user interface (GUI).