Material condition monitoring with multiple sensing modes

US7451657B2 · kind B2 · utility

Assignee

• JENTEK Sensors, Inc. · US

Inventors

• Neil J. Goldfine · Newton, US
• Darrell E. Schlicker · Watertown, US
• Vladimir A. Zilberstein · Sharon, US
• Andrew P. Washabaugh · Chula Vista, US
• Volker Weiss · Langenfeld, DE
• Christopher A. Craven · Bedford, US
• Ian Shay · Cambridge, US
• David C. Grundy · Reading, US
• Karen E. Walrath · Arlington, US
• Robert Joseph Lyons · Niskayuna, US

Key dates

• Filing date: Jan 14, 2005
• Grant date: Nov 18, 2008
• Expiry date: Apr 27, 2025

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N27/9013
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Methods are described for assessing material condition. These methods include the use of multiple source fields for interrogating and loading of a multicomponent test material. Source fields include electric, magnetic, thermal, and acoustic fields. The loading field preferentially changes the material properties of a component of the test material, which allows the properties of the component materials to be separated. Methods are also described for monitoring changes in material state using separate drive and sense electrodes with some of the electrodes positioned on a hidden or even embedded material surface. Statistical characterization of the material condition is performed with sensor arrays that provide multiple responses for the material condition during loading. The responses can be combined into a statistical population that permits tracking with respect to loading history. Methods are also described for measuring the stress in the material by independently estimating effective electrical properties, such as magnetic permeability or electrical conductivity, using layered models or predetermined spatial distributions with depth that are then correlated with the stress.