Method and apparatus for monitoring and enhancing on-chip microprocessor reliability
US7454316B2 · kind B2 · utility
26Cited by
7References
21Claims
0Family size
Assignee
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Key dates
| Filing date | Oct 8, 2004 |
| Grant date | Nov 18, 2008 |
| Priority date | — |
| Expiry date | Oct 8, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/07
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and method for projecting reliability to manage system functions includes an activity module which determines activity in the system. A reliability module interacts with the activity module to determine a reliability measurement for the module in real-time based upon the activity and measured operational quantities of the system. A management module manages actions of the system based upon the reliability measurement input from the reliability module. This may be to provide corrective action, to reallocate resources, increase reliability of the module, etc.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.