Method, system and computer program product for improving efficiency in generating high-level coverage data for a circuit-testing scheme
US7454680B2 · kind B2 · utility
0Cited by
2References
15Claims
0Family size
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Key dates
| Filing date | Jul 30, 2004 |
| Grant date | Nov 18, 2008 |
| Priority date | — |
| Expiry date | Apr 25, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/33
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method, system and computer program product for generating a coverage model to describe a testing scheme for a simulated system are described. In a preferred embodiment, a simulated system is tested with a testing simulation program. A simple event database is generated with the testing simulation program. Results of a checker analysis from the testing with the testing simulation program are obtained, and coverage data is created from a coverage model configuration file, the simple event database and the results of the checker analysis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.