NMR characterization of thin films
US7456630B2 · kind B2 · utility
3Cited by
6References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 11, 2006 |
| Grant date | Nov 25, 2008 |
| Priority date | — |
| Expiry date | Jul 11, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N24/081
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method, apparatus, and system for characterizing thin film materials. The method, apparatus, and system includes a container for receiving a starting material, applying a gravitational force, a magnetic force, and an electric force or combinations thereof to at least the starting material, forming a thin film material, sensing an NMR signal from the thin film material and analyzing the NMR signal to characterize the thin film of material.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.