Patent · US Expired

Method and device for the contour and/or deformation measurement, particularly the interference measurement, of an object

US7456973B2 · kind B2 · utility

10Cited by

5References

31Claims

0Family size

Assignee

STEINBICHLER OPTOTECHNIK GMBH · DE

Inventors

Hans Steinbichler · Neubeuern, DE
Roman Berger · Schnaitsee, DE
Thomas Mayer · Kolbermoor, DE

Key dates

Filing date	Apr 27, 2004
Grant date	Nov 25, 2008
Priority date	—
Expiry date	Nov 2, 2024

Classification

Technology area (CPC G)Physics
CPC primaryG01B11/2441
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The invention serves for the contour measurement and/or deformation measurement of an object, particularly a tire or a structural component of a composite material. The object is irradiated with light, particularly structured light, that is emitted by a radiation source and consists, in particular, of coherent light or partially coherent light, especially laser light. The light reflected by the object is picked up by a camera with an imaging sensor. In order to improve the image quality, a first image is produced with a first adjustment of the camera and/or the radiation source which is adapted to a first image region (13). In addition, a second image is produced with a second adjustment of the camera and/or the radiation source which is adapted to a second image region (12). Both images are combined (FIG. 5).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.