Statistical method of generating a synthetic hologram from measured data
US7456976B2 · kind B2 · utility
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2References
24Claims
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Key dates
| Filing date | Jul 29, 2005 |
| Grant date | Nov 25, 2008 |
| Priority date | — |
| Expiry date | Nov 8, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B9/02007
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Multiwavelength interferometric images have the phase and/or frequency of the illuminating light corrected by statistically analyzing the data, and adjusting the phase and/or frequency until a statistical measure reaches a criterion.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.