Scan register and methods of using the same
US7457998B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 7, 2005 |
| Grant date | Nov 25, 2008 |
| Priority date | — |
| Expiry date | Jul 8, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318541
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An improved scan register and methods of using the same have been disclosed. In one embodiment, the improved scan register includes a master latch having a data input, a data output, and a control input. The control input is coupled to a clock signal. The master latch is operable to store data. The improved scan register further includes a scan latch having a data input, a data output, and a control input. The data input of the scan latch is coupled to the data output of the master latch. The scan latch is operable to receive and to store the data from the master latch in response to the scan latch being in a scan mode. The improved scan register may further include a functional latch having a data input, a data output, and a control input. The data input of the functional latch is coupled to the data output of the master latch. The functional latch is operable to receive and to store the data from the master latch in response to the functional latch being in a functional mode. Other embodiments have been claimed and described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.