Electromagnetic shielding defect monitoring system and method for using the same
US7459916B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 30, 2006 |
| Grant date | Dec 2, 2008 |
| Priority date | — |
| Expiry date | Mar 30, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/001
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An embodiment disclosed herein is directed to an electromagnetic shielding defect monitoring system that includes a transmit system adapted to transmit a first electromagnetic field toward a first surface of an electromagnetically shielded enclosure, thereby generating a first current on the first surface, a stationary receive system adapted to detect a second electromagnetic field transmitted from a second surface of the electromagnetically shielded enclosure by a second current induced on the second surface by the first current and to generate a corresponding detected signal; control circuitry adapted to control operations of the transmit and receive systems; and analysis circuitry adapted to identify a location of a defect in the electromagnetically shielded enclosure based upon operations of the transmit and receive systems and based upon the detected signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.