Patent · US Expired

Measuring device for the optical analysis of a test strip

US7460222B2 · kind B2 · utility

42Cited by

3References

24Claims

0Family size

Assignee

Roche Diagnostics Operations, Inc. · US

Inventors

Stefan Kalveram · Viernheim, DE
Friedrich Ziegler · Stuttgart, DE
Hans-Peter Haar · Wiesloch, DE
Hans List · Prien am Chiemsee, DE
Jean-Michel Asfour · Weinheim, DE

Key dates

Filing date	Nov 14, 2003
Grant date	Dec 2, 2008
Priority date	—
Expiry date	Oct 7, 2024

Classification

Technology area (CPC G)Physics
CPC primaryG01N2201/0628
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The invention concerns a measuring device for the optical analysis of a diagnostic test element (10) comprising a light source (16), a photodetector (24) and a device (12) for positioning the test element (10) between the light source (16) and photodetector (24) where the light source (16) has one or several organic light-emitting diodes (OLEDs) and the OLEDs (14) for a composite structure with an imaging optics (20) and/or a photodetector (24) by means of a support substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.