System and method for identifying manufacturing data deviations
US7460917B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 30, 2005 |
| Grant date | Dec 2, 2008 |
| Priority date | — |
| Expiry date | Dec 15, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2219/37542
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
Systems and methods of industrial control processes that employ a data matching component associated with a programming logic controller (PLC), to substitute a plurality of collected data points with a data pattern (e.g., a curve). Such data matching component can facilitate data trending analysis, wherein a running industrial process can be compared with a predetermined criteria (industrial process with optimal/desired performance). A graphical tool (e.g., an on-screen) can be provided as part of the matching component, to enable a user to interactively set deviation thresholds from a predetermined criteria (e.g., optimum performance of an industrial operation.)
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.