Digital signature generation for hardware functional test
US7461312B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 22, 2004 |
| Grant date | Dec 2, 2008 |
| Priority date | — |
| Expiry date | Sep 21, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318566
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A Multiple Input Shift Register (MISR) is used to generate signatures, based on data from a device under test, in order to validate the proper sequence and content of the data over a defined period of time. The MISR described herein includes the ability to “tag” the signatures for each time period using an incrementing value, and make that tag and the signature readable by a test controller. The MISR has the flexibility to be reset to a known initial state (or otherwise load a seed value) at the beginning of each time period or to continue accumulating signatures without being reset (or using the seed value). Accumulation of signatures over an extended period of time allows a test controller to validate that no errors occurred during a long term test without having to closely monitor the intermediate results.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.