Statistical methods applied to surface chemistry in minerals flotation
US7462819B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 16, 2006 |
| Grant date | Dec 9, 2008 |
| Priority date | — |
| Expiry date | Jul 10, 2027 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/0004
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention provides a method of analysis which couples principle component analysis (PCA) with ToF-SIMS for obtaining surface chemical information from minerals. Statistical methods, based on the monolayer-sensitive time of flight secondary ion mass spectrometry (ToF-SIMS) technique, combined with principal component analysis (PCA) identifies combinations of factors strongly correlated (positively or negatively) in images or spectra from sets of data. In images, PCA selects these correlations from the mass spectra recorded at each of 256×256 pixels in a selected area of particles. In the image mode, PCA provides a much better method of selecting particles by mineral phase with clearer definition of particle boundaries due to multi-variable recognition.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.